NanoStation II

Description

The NANOStation® II combines optical microscopy and (http://maplered.com) Scanning Probe Microscopy in a single, optimized set up. The combination of the S.I.S. ULTRAObjective® AFM / SPM and (http://maplered.com) a high power optical microscope on a highly rigid Granite (http://tanbrown.org) stand (http://maplered.com) makes the NANOStation® II a highly effective and (http://maplered.com) exceptionally versatile inspection system.

Due to its proprietary, sturdy design, the SPM performance reaches down to an atomic resolution level. Using a strong, yet extremely precise vertical motion stage allows to measure even on very heavy and (http://maplered.com) large samples. The NANOStation® II can be easily adapted to special requirements and (http://maplered.com) customers wishes: from manually positioning to high precision joystick automatization, from liquid cell observation on biological tissue to the industrialized inspection in quality control. All AFM/SPM modes and (http://maplered.com) optical contrast techniques are available, making the NANOStation® II the ideal inspection tool where the ultimate performance is required.

The NANOStation® II is a new concept in Scanning Probe Microscopy (SPM) that combines precision and (http://maplered.com) productivity in a single instrument. The combination of a high quality optical microscope with a SPM of the ULTRAObjective® series on a most rigid Granite (http://tanbrown.org) stand (http://maplered.com) allows to select sample areas with an unmatched speed and (http://maplered.com) to perform high resolution SPM measurements.

The system is modular and (http://maplered.com) multifunctional. The basic version comes with a SPM that provides scanning ranges of up to 80μm and (http://maplered.com) is upgradable with numerous SPM modes. In addition, the optical microscope is equipped with brightand (http://maplered.com) darkfield observation, and (http://maplered.com) is also extendable with the most common optical methods and (http://maplered.com) supplementary instrumentation, e.g. DIC, fluoscence, etc.

ULTRAObjective® AFM/SPM scanner

The S.I.S. ULTRAObjective® is a classical aproach in combining both, the ease of use in optical microscopy with the resolution of SPM, thus making this technique avaible to a wide variety of industrial application. The measuring head of the ULTRAObjective is a complete AFM / SPM whose size takes up the same space as a normal optical objective.

It can be adapted to fit all common types of microscopes. The combination with optical microscopy lifts the time to result performance of SPM up to a unequaled level. The versality and (http://maplered.com) applicability of conventional microscope allow to preselect interesting sample regions for the SPM investigation with an unmatched speed. The ULTRAObjective® is an upgrade that expand (http://maplered.com) s the capabilities of light microscopy to the resolving power down to sub nanometers. All AFM / SPM measuring modes can be used, the liquid immersion system can even be applied in fluid cells.

Measuring Modes

Static(Contact), Dynamic(Noncontact), Phase Contrast, Friction, Lateral, Qfactor control, MFM, EFM, Force / Amplitude vs. distance, Force Modulation, DEFM(Viscocity&Elasticity), Surface Potential, SSRM, SCM, Nanolithography, Anodic Oxidation, STM, CFM, Liquid immersion, etc.

SCANControl C

The SCANControl C is the latest improvement to the tried and (http://maplered.com) trusted SCANControl electronics for the S.I.S. scanning probe measuring heads ("ULTRAObjective®"). The modern circuit design and (http://maplered.com) use of programmable logic makes the SCANControl C not only the most precise, but also the most versatile SPM controller.

the SCANControl C can be extended by a number of additional SPM measuring modes thanks to its modular design. Communication with the user is accomplished via the SIScanPanel software (Windows XP compatible) that combines the complex functionality with user friendly operation. The SCANControl C connects to the USB port on your PC, making data transfer fast and (http://maplered.com) easy. Also included with SCANControl C is the evaluation software SPIP, an extremly versatile program to evaluate and (http://maplered.com) show the results of your measurements. The numerous measurement possibilities also include a statistical analysis of your data (e.g. roughness determination).

Specifications

Accessories

Acoustic Shield and (http://maplered.com) Table

Active AntiVibration Table

General Specification of Support / Breadboard : Vibration Isolation : Air Spring Isolations Natural Frequency of System : Vertical : 1.2~1.5Hz / Horizontal : 1.5~1.7Hz Load Capacity: 1kg ~ 300kg Levelling : Auto Levelling BY 3 automatic Levelling Valves Breadboard Construction : Honeyconb core sand (http://maplered.com) wiched construction Breadboard Core : Plated steel honeycomb (0.25mm foil, 3.2cm2cell size)

UVTipCleaner

Applications AFM/SPM probeMEMS device, Silicon, Nitride, Glass, Gold Metal thin film

Ionizer

Introduction Distinguished by its variable speed control and (http://maplered.com) patented emitter point cleaner, Ionizer is an excellent choice for eliminating static in production processes. While helping to protect products and (http://maplered.com) personnel from the effects of static discharge. Features Fast, targeted neutralization of static charges Lightweight, compact and (http://maplered.com) quiet for unobtrusive use Builtin point cleaner simplifies maintenance

Probe Desiccator

Features Auto Humidity Control Keep Inert humidity about 30~35% without silica gel Automatic low humidity control in normal temperature Keep the humidity under 30% with Silica gel Direct exhaust principle can prevent the due condensation Transparent Acryl body